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Data base of microwave absorbing materials are continously updated. Such materials are used to built the multilayer structures.
The microwave characterization has been carried out performing scattering measurements and extracting the electrical permittivity through canonical algorithms.. We adopted and compared Nicholson-Ross and New Non Iterative algorithms..
Measurements setup consists of a vector network analyzer (VNA) Agilent PNA L working up to 20 GHz, wave guide calibration kit in the X-band (8.2-12.4 GHz), sample holder hosting the material under test (MUT) of 9.77 mm thickness. Permittivity results give wave impedance values.
Several technique of design and optimization are used, some of them adopt Genetic Algorithms and Particle Swarm Optimization and Winning Particle Optimization
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